Matching properties of deep sub-micron MOS transistors

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Bibliographic Details
Main Author: Croon, Jeroen A
Other Authors: Maes, H. E. (Herman E.), Sansen, Willy M. C
Format: Book
Published: New York Springer 2005
Series:The Kluwer international series in engineering and computer science, 851
Subjects:
Online Access:Click Here to View Status and Holdings.
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