Matching properties of deep sub-micron MOS transistors

Matching properties of deep sub-micron MOS transistors

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Bibliographic Details
Main Author: Croon, Jeroen A
Other Authors: Maes, H. E. (Herman E.), Sansen, Willy M. C
Format: Unknown
Published: New York Springer 2005
Series:The Kluwer international series in engineering and computer science, 851
Subjects:
Metal oxide semiconductor field-effect transistors
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:x, 206 p. ill. 25 cm
Bibliography:Includes bibliographical references (p. [193]-203)
ISBN:0387243143 (hd.bd.)
0387243135 (e-book)
ISSN:0893-3405 ;

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