Computed electron micrographs and defect identification.

Computed electron micrographs and defect identification.

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Bibliographic Details
Other Authors: Head, A. K
Format: Book
Published: Amsterdam North-Holland Pub. Co. 1973
Series:Defects in crystalline solids v. 7
Subjects:
Metals > Defects > Data processing
Electron microscopy > Data processing
Online Access:Click Here to View Status and Holdings.
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