Computed electron micrographs and defect identification.

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Bibliographic Details
Other Authors:	Head, A. K
Format:	Book
Published:	Amsterdam North-Holland Pub. Co. 1973
Series:	Defects in crystalline solids v. 7
Subjects:	Metals > Defects > Data processing Electron microscopy > Data processing
Online Access:	Click Here to View Status and Holdings.
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