Computed electron micrographs and defect identification.

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Bibliographic Details
Other Authors:	Head, A. K
Format:	Book
Published:	Amsterdam North-Holland Pub. Co. 1973
Series:	Defects in crystalline solids v. 7
Subjects:	Metals > Defects > Data processing Electron microscopy > Data processing
Online Access:	Click Here to View Status and Holdings.
Tags:	Add Tag No Tags, Be the first to tag this record!

MARC


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020	#	#	\|a 0444104623
090	0	0	\|a QD921 \|b .C62 1973
245	1	1	\|a Computed electron micrographs and defect identification. \|c by A. K. Head...[et al.]
260	#	#	\|a Amsterdam \|b North-Holland Pub. Co. \|c 1973
300	#	#	\|a x, 400 p. with ill. \|c 23 cm
490	1	#	\|a Defects in crystalline solids \|v v. 7
504	#	#	\|a Bibliography: p. [387]-389.
650	#	0	\|a Metals \|x Defects \|x Data processing
650	#	0	\|a Electron microscopy \|x Data processing
700	1	#	\|a Head, A. K
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=34077
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam