Infrared characterization for microelectronics

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Bibliographic Details
Main Author:	Lau, W. S
Format:	Book
Published:	Singapore River Edge, NJ World Scientific 1999
Subjects:	Absorption spectra Infrared spectroscopy Microelectronics > Materials > Testing
Online Access:	Click Here to View Status and Holdings.
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090	0	0	\|a TK7871 \|b .L38 1999
100	1	#	\|a Lau, W. S
245	1	1	\|a Infrared characterization for microelectronics \|c W.S. Lau
260	#	#	\|a Singapore \|a River Edge, NJ \|b World Scientific \|c 1999
300	#	#	\|a x, 160 p. \|b ill. \|c 23 cm
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Absorption spectra
650	#	0	\|a Infrared spectroscopy
650	#	0	\|a Microelectronics \|x Materials \|x Testing
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=336109
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