Value analysis tear-down a new process for product development and innovation

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Bibliographic Details
Main Author:	Sato, Yoshihiko
Other Authors:	Kaufman, J. Jerry
Format:	Unknown
Published:	New York Industrial Press 2005
Subjects:	Engineering economy Value analysis (Cost control) New products Industrial productivity
Online Access:	Click Here to View Status and Holdings.
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020	#	#	\|a 0831132035 (professional/textbook : alk. paper)
090	0	0	\|a HD47.3 \|b .S38 2005
100	1	#	\|a Sato, Yoshihiko
245	1	1	\|a Value analysis tear-down \|b a new process for product development and innovation \|c Yoshihiko Sato and J. Jerry Kaufman
260	#	#	\|a New York \|b Industrial Press \|c 2005
300	#	#	\|a p. cm
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Engineering economy
650	#	0	\|a Value analysis (Cost control)
650	#	0	\|a New products
650	#	0	\|a Industrial productivity
700	1	#	\|a Kaufman, J. Jerry
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=329903
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
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