Value analysis tear-down a new process for product development and innovation

Value analysis tear-down a new process for product development and innovation

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Bibliographic Details
Main Author: Sato, Yoshihiko
Other Authors: Kaufman, J. Jerry
Format: Unknown
Published: New York Industrial Press 2005
Subjects:
Engineering economy
Value analysis (Cost control)
New products
Industrial productivity
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:p. cm
Bibliography:Includes bibliographical references and index
ISBN:0831132035 (professional/textbook : alk. paper)

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