World class reliability using Multiple Environment Overstress tests to make it happen

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Bibliographic Details
Main Author: Bhote, Keki R. 1925-
Other Authors: Bhote, Adi K
Format: Book
Published: New York American Management Association 2004
Subjects:
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:xix, 218 p. ill. 24 cm
Bibliography:Includes bibliographical references (p. 209-210) and index
ISBN:0814407927