Applied scanning probe methods
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| Other Authors: | , , |
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| Format: | Unknown |
| Published: |
Berlin New York
Springer
2004
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| Series: | Nanoscience and technology
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| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Scanning probe microscopy for industrial applications nanomechanical characterization
Biological Low-Voltage Scanning Electron Microscopy
Modeling nanoscale imaging in electron microscopy
