Semiconductor memories technology, testing, and reliability
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| Format: | Book |
| Published: |
New York Hoboken, N.J.
IEEE, the Institute of Electrical and Electronics Engineers Wiley-Interscience
1997
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| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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| 020 | # | # | |a 0780310004 |
| 090 | 0 | 0 | |a TK7895.M4 |b .S49 1997b |
| 100 | 1 | # | |a Sharma, Ashok K |
| 245 | 1 | 1 | |a Semiconductor memories |b technology, testing, and reliability |c Ashok K. Sharma |
| 260 | # | # | |a New York |a Hoboken, N.J. |b IEEE, the Institute of Electrical and Electronics Engineers |b Wiley-Interscience |c 1997 |
| 300 | # | # | |a xii, 462 p. |b ill. |c 26 cm |
| 500 | # | # | |a "IEEE Solid-State Circuits Council, sponsor." |
| 504 | # | # | |a Includes bibliographical references and index |
| 650 | # | 0 | |a Semiconductor storage devices |
| 710 | 1 | # | |a IEEE Solid-State Circuits Council |
| 856 | 4 | 0 | |z Click Here to View Status and Holdings. |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=293912 |
| 964 | # | # | |c BOK |d 01 |
| 040 | # | # | |a Shah Alam |
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Semiconductor memories technology, testing and reliability