Semiconductor memories technology, testing, and reliability
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Main Author: | |
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Corporate Author: | |
Format: | Book |
Published: |
New York Hoboken, N.J.
IEEE, the Institute of Electrical and Electronics Engineers Wiley-Interscience
1997
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Subjects: | |
Online Access: | Click Here to View Status and Holdings. |
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Item Description: | "IEEE Solid-State Circuits Council, sponsor." |
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Physical Description: | xii, 462 p. ill. 26 cm |
Bibliography: | Includes bibliographical references and index |
ISBN: | 0780310004 |