Semiconductor memories technology, testing, and reliability

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Bibliographic Details
Main Author: Sharma, Ashok K
Corporate Author: IEEE Solid-State Circuits Council
Format: Book
Published: New York Hoboken, N.J. IEEE, the Institute of Electrical and Electronics Engineers Wiley-Interscience 1997
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Description
Item Description:"IEEE Solid-State Circuits Council, sponsor."
Physical Description:xii, 462 p. ill. 26 cm
Bibliography:Includes bibliographical references and index
ISBN:0780310004