High performance memory testing design princioles, fault modelling and self-test
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| Format: | Unknown |
| Published: |
Boston
Kluwer Academic
2003
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| Online Access: | Click Here to View Status and Holdings. |
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Add Tag | Physical Description: | xiii, 246 p. ill. 24 cm |
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| Bibliography: | Includes bibliographical references and index |
| ISBN: | 1402072554 |
Semiconductor memories technology, testing and reliability