MOS (metal oxide semiconductor) physics and technology
Saved in:
Main Author: | E.H, Nicollian |
---|---|
Other Authors: | Brews, J.R |
Format: | Book |
Published: |
New Jersey
John wiley & Sons
2003
|
Series: | Wiley classics library
|
Subjects: | |
Online Access: | Click Here to View Status and Holdings. |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Study of metal-oxide-semiconductor (MOS) structure characteristics with different annealing temperature
by: Siti Fatimah Saipuddin
Published: (2012) -
Operation and modeling of the MOS transistor
by: Tsividis, Yannis
Published: (1999) -
Hot-carrier effects in MOS devices
by: Takeda, Eiji 1944-
Published: (1995) -
Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability
Published: (2002) -
Matching properties of deep sub-micron MOS transistors
by: Croon, Jeroen A
Published: (2005)