High level test synthesis of digital VLSI circuits

High level test synthesis of digital VLSI circuits

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Bibliographic Details
Main Author: Lee, Mike Tien-Chien
Format: Book
Published: Boston Artech House 1997
Subjects:
Integrated circuits > Very large scale integration > Computer-aided design
Integrated circuits > Very large scale integration > Testing > Data processing
Digital integrated circuits > Testing > Data processing
Online Access:Click Here to View Status and Holdings.
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