High level test synthesis of digital VLSI circuits

Saved in:

Bibliographic Details
Main Author:	Lee, Mike Tien-Chien
Format:	Book
Published:	Boston Artech House 1997
Subjects:	Integrated circuits > Very large scale integration > Computer-aided design Integrated circuits > Very large scale integration > Testing > Data processing Digital integrated circuits > Testing > Data processing
Online Access:	Click Here to View Status and Holdings.
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet