High level test synthesis of digital VLSI circuits

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Bibliographic Details
Main Author:	Lee, Mike Tien-Chien
Format:	Unknown
Published:	Boston Artech House 1997
Subjects:	Integrated circuits > Very large scale integration > Computer-aided design Integrated circuits > Very large scale integration > Testing > Data processing Digital integrated circuits > Testing > Data processing
Online Access:	Click Here to View Status and Holdings.
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