High level test synthesis of digital VLSI circuits

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Bibliographic Details
Main Author:	Lee, Mike Tien-Chien
Format:	Unknown
Published:	Boston Artech House 1997
Subjects:	Integrated circuits > Very large scale integration > Computer-aided design Integrated circuits > Very large scale integration > Testing > Data processing Digital integrated circuits > Testing > Data processing
Online Access:	Click Here to View Status and Holdings.
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020	#	#	\|a 0890069077
090	0	0	\|a TK7874.75 \|b .L44 1997
100	1	#	\|a Lee, Mike Tien-Chien
245	1	1	\|a High level test synthesis of digital VLSI circuits \|c Mike Tien-Chien Lee
260	#	#	\|a Boston \|b Artech House \|c 1997
300	#	#	\|a xi, 220 p. \|b ill. \|c 23 cm
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Integrated circuits \|x Very large scale integration \|x Computer-aided design
650	#	0	\|a Integrated circuits \|x Very large scale integration \|x Testing \|x Data processing
650	#	0	\|a Digital integrated circuits \|x Testing \|x Data processing
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=260902
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
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