Applied logistic regression

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Bibliographic Details
Main Author: Hosmer, David W
Other Authors: Lemeshow, Stanley
Format: Book
Published: New York John Wiley & Sons 2000
Edition:2nd ed
Series:Wiley series in probability and statistics
Subjects:
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:xii, 373 p. 24 cm
Bibliography:Includes bibliographical references and index
ISBN:0471356328