Integrated circuit failure analysis a guide to preparation techniques

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Bibliographic Details
Main Author:	Beck, Friedrich
Other Authors:	Wilson, Stephen S.
Format:	Book
Published:	Chichester John Wiley 1998
Series:	Wiley series in quality and reliability engineering
Subjects:	Semiconductors > Testing Semiconductors > Failures
Online Access:	Click Here to View Status and Holdings.
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090	0	0	\|a TK7871.852 \|b .B43 1998
100	1	#	\|a Beck, Friedrich
245	1	1	\|a Integrated circuit failure analysis \|b a guide to preparation techniques \|c Friedrich Beck \|f translated by Stephen S. Wilson
260	#	#	\|a Chichester \|b John Wiley \|c 1998
300	#	#	\|a xiv, 173 p. \|b ill. \|c 24 cm
490	1	#	\|a Wiley series in quality and reliability engineering
650	#	0	\|a Semiconductors \|x Testing
650	#	0	\|a Semiconductors \|x Failures
700	1	#	\|a Wilson, Stephen S.
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=210188
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