Integrated circuit failure analysis a guide to preparation techniques

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Bibliographic Details
Main Author: Beck, Friedrich
Other Authors: Wilson, Stephen S.
Format: Unknown
Published: Chichester John Wiley 1998
Series:Wiley series in quality and reliability engineering
Subjects:
Online Access:Click Here to View Status and Holdings.
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260 # # |a Chichester  |b John Wiley  |c 1998 
300 # # |a xiv, 173 p.  |b ill.  |c 24 cm 
490 1 # |a Wiley series in quality and reliability engineering 
650 # 0 |a Semiconductors  |x Testing 
650 # 0 |a Semiconductors  |x Failures 
700 1 # |a Wilson, Stephen S. 
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