Microelectronic systems design, modelling and testing

Saved in:

Bibliographic Details
Main Author:	Buchanan, William
Format:	Unknown
Published:	London Arnold 1997
Subjects:	Integrated circuits > Design and construction Microelectronics
Online Access:	Click Here to View Status and Holdings.
Tags:	Add Tag No Tags, Be the first to tag this record!

MARC


LEADER	00000n a2200000 a 4501
001	wils-209904
020	#	#	\|a 0340677716
090	0	0	\|a TK7874 \|b .B74 1997
100	1	#	\|a Buchanan, William
245	1	1	\|a Microelectronic systems \|b design, modelling and testing \|c W. Buchanan
260	#	#	\|a London \|b Arnold \|c 1997
300	#	#	\|a xiv, 314 p. \|b ill. \|c 23 cm
500	#	#	\|a Includes index
650	#	0	\|a Integrated circuits \|x Design and construction
650	#	0	\|a Microelectronics
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=209904
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
998	#	#	\|a 00260##a002.8.2\|\|00260##b002.8.4\|\|00260##c002.7.6\|\|00300##a003.4.1\|\|00300##b003.6.1\|\|00300##c003.5.1\|\|00500##a002.17.2\|\|