Semiconductor memories technology, testing and reliability

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Bibliographic Details
Main Author:	Sharma, Ashok K.
Format:	Unknown
Published:	London IEEE Press 1997
Subjects:	Semiconductor storage devices
Online Access:	Click Here to View Status and Holdings.
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020	#	#	\|a 0780311140
090	0	0	\|a TK7895.M4 \|b S53 1997
100	1	#	\|a Sharma, Ashok K.
245	1	1	\|a Semiconductor memories \|b technology, testing and reliability \|c Ashok K. Sharma
260	#	#	\|a London \|b IEEE Press \|c 1997
300	#	#	\|a xii, 462 p. \|b ill. \|c 26 cm
500	#	#	\|a Includes index
650	#	0	\|a Semiconductor storage devices
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=191904
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
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