Semiconductor memories technology, testing and reliability
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Published: |
London
IEEE Press
1997
|
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Add Tag | Item Description: | Includes index |
|---|---|
| Physical Description: | xii, 462 p. ill. 26 cm |
| ISBN: | 0780311140 |
Semiconductor memories technology, testing, and reliability