Electron and ion microscopy and microanalysis principles and applications
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| Main Author: | |
|---|---|
| Format: | Unknown |
| Published: |
New York
Marcel Dekker
1982
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| Series: | Optical engineering
v. 1 |
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Field-ion microscopy
ATOMIC FORCE MICROSCOPY PRINCIPLES, DEVELOPMENTS AND APPLICATIONS
Modeling nanoscale imaging in electron microscopy
