Electron and ion microscopy and microanalysis principles and applications
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| Main Author: | |
|---|---|
| Format: | Book |
| Published: |
New York
Marcel Dekker
1982
|
| Series: | Optical engineering
v. 1 |
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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| LEADER | 00000n a2200000 a 4501 | ||
|---|---|---|---|
| 001 | wils-182379 | ||
| 020 | # | # | |a 0824715535 |
| 090 | 0 | 0 | |a QH212.E4 |b M87 1982 |
| 100 | 1 | # | |a Murr, Lawrence Eugene |
| 245 | 1 | 1 | |a Electron and ion microscopy and microanalysis |b principles and applications |c Lawrence Eugene Murr |
| 260 | # | # | |a New York |b Marcel Dekker |c 1982 |
| 300 | # | # | |a xiv, 793 p. |b ill. |c 27 cm |
| 490 | 1 | # | |a Optical engineering |v v. 1 |
| 504 | # | # | |a Includes bibliographical references and indexes |
| 650 | # | 0 | |a Microprobe analysis |
| 650 | # | 0 | |a Electron microscopy |
| 650 | # | 0 | |a Field ion microscopy |
| 856 | 4 | 0 | |z Click Here to View Status and Holdings. |u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=182379 |
| 964 | # | # | |c BOK |d 01 |
| 040 | # | # | |a Shah Alam |
Field-ion microscopy