Electron and ion microscopy and microanalysis principles and applications

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Bibliographic Details
Main Author:	Murr, Lawrence Eugene
Format:	Unknown
Published:	New York Marcel Dekker 1982
Series:	Optical engineering v. 1
Subjects:	Microprobe analysis Electron microscopy Field ion microscopy
Online Access:	Click Here to View Status and Holdings.
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MARC


LEADER	00000n a2200000 a 4501
001	wils-182379
020	#	#	\|a 0824715535
090	0	0	\|a QH212.E4 \|b M87 1982
100	1	#	\|a Murr, Lawrence Eugene
245	1	1	\|a Electron and ion microscopy and microanalysis \|b principles and applications \|c Lawrence Eugene Murr
260	#	#	\|a New York \|b Marcel Dekker \|c 1982
300	#	#	\|a xiv, 793 p. \|b ill. \|c 27 cm
490	1	#	\|a Optical engineering \|v v. 1
504	#	#	\|a Includes bibliographical references and indexes
650	#	0	\|a Microprobe analysis
650	#	0	\|a Electron microscopy
650	#	0	\|a Field ion microscopy
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=182379
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
998	#	#	\|a 00260##a002.8.2\|\|00260##b002.8.4\|\|00260##c002.7.6\|\|00300##a003.4.1\|\|00300##b003.6.1\|\|00300##c003.5.1\|\|