Electron and ion microscopy and microanalysis principles and applications
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| Main Author: | |
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| Format: | Unknown |
| Published: |
New York
Marcel Dekker
1982
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| Series: | Optical engineering
v. 1 |
| Subjects: | |
| Online Access: | Click Here to View Status and Holdings. |
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Add Tag | Physical Description: | xiv, 793 p. ill. 27 cm |
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| Bibliography: | Includes bibliographical references and indexes |
| ISBN: | 0824715535 |
Field-ion microscopy