$Quantitative X-ray diffractometry$

Quantitative X-ray diffractometry

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Bibliographic Details
Main Author:	Zevin, Lev S
Other Authors:	Kimmel, Giora, Mureinik, Inez
Format:	Book
Published:	New York Springer-Verlag 1995
Subjects:	X-rays > Diffraction > Industrial applications X-rays > Diffraction
Online Access:	Click Here to View Status and Holdings.
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