Quantitative X-ray diffractometry

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Bibliographic Details
Main Author: Zevin, Lev S
Other Authors: Kimmel, Giora, Mureinik, Inez
Format: Book
Published: New York Springer-Verlag 1995
Subjects:
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Description
Physical Description:xvii, 372 p. ill. 23 cm
Bibliography:Includes bibliographical references
ISBN:0387945415