Materials reliability in microelectronics II proceedings of the ... held April 27-May 1, 1992

Saved in:

Bibliographic Details
Corporate Author:	Symposium on Materials Reliability in Microelectronics II
Other Authors:	Thompson, C. V. Carl V, Lloyd, J. R. James R
Format:	Unknown
Published:	Pittsburgh, Penn. Materials Research Society l992
Series:	Materials Research Society symposium proceedings v265
Subjects:	Microelectronics > Reliability > Congresses Microelectronics > Materials > Testing > Congresses Electrodiffusion > Congresses
Online Access:	Click Here to View Status and Holdings.
Tags:	Add Tag No Tags, Be the first to tag this record!

Be the first to leave a comment!

Similar Items