Materials reliability in microelectronics II proceedings of the ... held April 27-May 1, 1992

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Bibliographic Details
Corporate Author:	Symposium on Materials Reliability in Microelectronics II
Other Authors:	Thompson, C. V. Carl V, Lloyd, J. R. James R
Format:	Unknown
Published:	Pittsburgh, Penn. Materials Research Society l992
Series:	Materials Research Society symposium proceedings v265
Subjects:	Microelectronics > Reliability > Congresses Microelectronics > Materials > Testing > Congresses Electrodiffusion > Congresses
Online Access:	Click Here to View Status and Holdings.
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