Materials reliability in microelectronics II proceedings of the ... held April 27-May 1, 1992

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Bibliographic Details
Corporate Author:	Symposium on Materials Reliability in Microelectronics II
Other Authors:	Thompson, C. V. Carl V, Lloyd, J. R. James R
Format:	Book
Published:	Pittsburgh, Penn. Materials Research Society l992
Series:	Materials Research Society symposium proceedings v265
Subjects:	Microelectronics > Reliability > Congresses Microelectronics > Materials > Testing > Congresses Electrodiffusion > Congresses
Online Access:	Click Here to View Status and Holdings.
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LEADER	00000n a2200000 a 4501
001	wils-103365
020	#	#	\|a 1558991603
090	0	0	\|a TK7874 \|b .S96 1992
110	1	#	\|a Symposium on Materials Reliability in Microelectronics II \|j San Francisco, California \|k 1992
245	1	1	\|a Materials reliability in microelectronics II \|b proceedings of the ... held April 27-May 1, 1992 \|c editors, C. V. Thompson, J. R. Lloyd
260	#	#	\|a Pittsburgh, Penn. \|b Materials Research Society \|c l992
300	#	#	\|a ix, 328 p. \|b ill. \|c 24 cm
490	1	#	\|a Materials Research Society symposium proceedings \|v v265
504	#	#	\|a Includes bibliographical references and index
650	#	0	\|a Microelectronics \|x Reliability \|x Congresses
650	#	0	\|a Microelectronics \|x Materials \|x Testing \|x Congresses
650	#	0	\|a Electrodiffusion \|x Congresses
700	1	#	\|a Thompson, C. V. \|q Carl V
700	#	#	\|a Lloyd, J. R. \|q James R
745	#	#	\|a Materials reliability in microelectronics 2
745	#	#	\|a Materials reliability in microelectronics two
856	4	0	\|z Click Here to View Status and Holdings. \|u https://opac.uitm.edu.my/opac/detailsPage/detailsHome.jsp?tid=103365
964	#	#	\|c BOK \|d 01
040	#	#	\|a Shah Alam
998	#	#	\|a 00260##a002.8.2\|\|00260##b002.8.4\|\|00260##c002.7.6\|\|00300##a003.4.1\|\|00300##b003.6.1\|\|00300##c003.5.1\|\|01700##a0011.2.2\|\|01700##q0017.8\|\|