Materials reliability in microelectronics II proceedings of the ... held April 27-May 1, 1992

Materials reliability in microelectronics II proceedings of the ... held April 27-May 1, 1992

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Bibliographic Details
Corporate Author: Symposium on Materials Reliability in Microelectronics II
Other Authors: Thompson, C. V. Carl V, Lloyd, J. R. James R
Format: Book
Published: Pittsburgh, Penn. Materials Research Society l992
Series:Materials Research Society symposium proceedings v265
Subjects:
Microelectronics > Reliability > Congresses
Microelectronics > Materials > Testing > Congresses
Electrodiffusion > Congresses
Online Access:Click Here to View Status and Holdings.
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Description
Physical Description:ix, 328 p. ill. 24 cm
Bibliography:Includes bibliographical references and index
ISBN:1558991603

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