Applied logistic regression

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Bibliographic Details
Main Author: Hosmer, David W
Other Authors: Lemeshow, Stanley
Format: Unknown
Published: New York Wiley 1989
Series:Wiley series in probability and mathematical statistics.
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Description
Item Description:"A Wiley-Interscience publication."
Physical Description:xiii, 307 p. 24 cm
Bibliography:Includes bibliographical references (p. 291-300) and index.
ISBN:0471615536