Search Results - Sachdev, Manoj

Manoj Sachdev

Manoj Sachdev from the University of Waterloo, Waterloo, ON, Canada was named Fellow of the Institute of Electrical and Electronics Engineers (IEEE) in 2012 ''for contributions to test methodology for very large scale integrated circuits''. Provided by Wikipedia
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    Defect-oriented testing for nano-metric CMOS VLSI circuit

    Defect-oriented testing for nano-metric CMOS VLSI circuit by Sachdev, Manoj

    Published 2007
    Other Authors: “…Sachdev, Manoj…”
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    Thermal and power management of integrated circuits

    Thermal and power management of integrated circuits by Vassighi, Arman 1966-

    Published 2006
    Other Authors: “…Sachdev, Manoj…”
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